Informatique
Low Temperature Test |
Test parameters |
Main influence |
Typical failure results |
Low Temperature |
Embrittlement; icing; viscosity increase and solidification; the decrease of mechanical strength; physical shrinkage. |
Insulation failure, cracking, mechanical failure, increased wear of moving parts due to shrinkage or loss of lubricant performance, failure of seals and seals. |
Test Capability of ORT Low Temperature Test
Min. Temperature: -70℃
Applicable standards: IEC 60068-2-1, GB/T 2423.1, MIL-STD-810H, MIL-STD-883K, MIL-STD-202G, GJB 150A, GJB 360B, GJB 548B, GB/T 28046.4, ISO 16750- 4. YD/T 2379, ETSI 300 019-2, GR-63, GR-487, etc.
Low Temperature Test Gallery
As one of tic industry companies, we have types of tic testing for sale, if you have needs, please contact us.
Bonne affaire : acheter au vendeur
Cette page concerne les importateurs et exportateurs de Low Temperature Test Rechercher dans la catégorie : Informatique Rechercher dans la catégorie : temperature, test |
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